|
Equipment |
Type/Code |
Description |
|
1 | Transmission Electron Microscope (TEM) |
Tecnai G2 F20 |
The easy-to-use 200 kV microscope (Tecnai G2 F20), manufactured by FEI, provides superb performance of a 0.24 nm point-to-point resolution and a 0.15 nm information limit for TEM mode and a 0.2 nm spo... |
 |
2 | Hitachi Scanning Electron Microscope (Hitachi SEM&EDS) |
S-2600N |
The Hitachi S-2600N scanning electron microscope (1-30 kV) enables speedy morphology and composition characterizations at nanoscale resolution. ... |
 |
3 | JSM-6490LV & Oxford EDS system (JEOL SEM&EDS) |
6490LV |
JSM-6490LV is an easy operated Scanning Electron Microscope to characterize the morphology of various materials. It is equipped with Oxford EDS system to provide the element microanalysis at the same ... |
 |
4 | Quanta450 FEG SEM/EBL (Quanta450) |
HR-SEM/EBL |
The FEI Quanta450 FEG environmental Scanning Electron Microscope (ESEM) characterizes both conductive and non-conductive samples with SE and BSE high-resolution imaging. The combined Nabity NPGS E-Be... |
 |
5 | Atomic Force Microscope (TT-AFM) |
AFM workshop |
The AFM lab, integrating both research and teaching functions, features 5 TT-AFMs made by AFM Workshop. Users can study the surface topography of their samples at a nanometer or even sub-nanometer re... |
 |
6 | Transmission Digital Holography Microscope (DHM-T) |
DHM T-1000 |
DHM (Digital Holography Microscope) systems are based on a very robust new
technology allowing high frequency measurements at interferometric resolution.
They are the first instruments to give simul... |
 |
7 | Bruker FTIR (FTIR ) |
BrukerFTIR |
FTIR, MidIR, NearIR, Transmission, Reflection, Microscope, Bench, Grazing Angle, ATR... |
 |
8 | Confocal Laser Scanning Microscope (Confocal) |
OLS 3100 |
Olympus LEXT OLS 3100
Light Source: 408nm LD
Lateral Resolution: 200nm
Vertical Resolution: 10nm
3D Profile Reconstruction... |
 |
9 | Cryo-Ultramicrotome |
Leica UC7/FC7 |
Can be used to prepare specimens for TEM/SEM.... |
 |
10 | Zeta potential and particle size analyzer (ZetaPLUS) |
ZetaPLUS |
ZetaPLUS can measure both particle size (2 − 3,000 nm)and zeta-potential (-220 to 220 mV) of nano- and micro- particles as well as polymers and proteins, based on the dynamic light scattering. Wave ... |
 |
11 | Rame-Hart Goniometer (Goniometer) |
Rame-Hart 250 |
The Rame-Hart Goniometer (Model 250) is a powerful tool for measuring the contact angle, surface energy, surface tension, interfacial tension, etc. It works with pendant, inverted pendant, sessile, an... |
 |
12 | Baltec BAF060 freeze etching system (Freeze fracture) |
BAF060 |
Can be used to make replicas of a fractured frozen sample surface. ... |
 |
13 | Leica EM PACT 2 high pressure freezer (HPF) |
EM Pact 2 |
To vitrify aqueous materials... |
 |
14 | ThermoFisher Scientific Rheometer HAAKE MARS II (Rheometer) |
HAAKE MARS II |
This highly flexible Modular Advanced Rheometer System (MARS) provides accuracy, easy handling, and many application-oriented solutions for comprehensive material characterization. New Connect Assist ... |
 |
15 | Differential Scanning Calorimeter (DSC) |
Perkin Elmer/DSC7 |
The Perkin Elmer DSC7 measures thermal properties of liquids and solids such as the melting temperature and the accompanying latent heat. The operating range is between -10˚ C and 600˚ C.... |
 |
16 | High Speed Camera (HS-camera) |
Phantom v211 |
A high-speed camera is a central instrumet for softmater recearch such as microfluidics, in which tiny microdrops and bubbles are formed so fast that most of cameras cannot properly caputre their moti... |
 |
17 | Spectrofluorometer (Fluorolog-3) |
Fluorolog-3 |
The Fluorolog®-3 is a unique, modular system which allows the researcher to interchange a versatile range of accessories to correspond perfectly with the characteristics of a given sample. From analy... |
 |
18 | Chroma Meter (CR-241) |
Minolta CR-241 |
Determines the color coordinates of reflective samples in the CIE Standard Observer format. ... |
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