Welcome to the LCI Characterization Facility    

The LCI Characterization Facility, located on the ground floor of the north section of the Liquid Crystal and Materials Sciences Building, is an open access user facility to provide a comprehensive series of instruments and analytical tools to conduct structural, physical, chemical and electrical characterization of soft-matter and devices. Users from academic institutions and industry are welcome to get their research project done with professional quality by themselves or by the LCI staff. The Characterization Facility serves also as a center of hands-on training and education on advanced analytical techniques.

  • Microscopy (TEM, SEM, SPM, Optical)
  • Thermal and Phase Properties
  • Optical and Electo-optical Properties
  • Surface Properties
  • Fluid Dynamic Properties
  • Mechanical and Rheological Properties
Characterization Facility Floor Plan
Equipment Type/Code Description
1 Transmission Electron Microscope (TEM) Tecnai G2 F20 The easy-to-use 200 kV microscope (Tecnai G2 F20), manufactured by FEI, provides superb performance of a 0.24 nm point-to-point resolution and a 0.15 nm information limit for TEM mode and a 0.2 nm spo... Resource Photo
2 Scanning Electron Microscope (SEM) S-2600N The Hitachi S-2600N scanning electron microscope (1-30 kV) enables speedy morphology and composition characterizations at nanoscale resolution. ... Resource Photo
3 Atomic Force Microscope (TT-AFM) AFM workshop The AFM lab, integrating both research and teaching functions, features 5 TT-AFMs made by AFM Workshop. Users can study the surface topography of their samples at a nanometer or even sub-nanometer re... Resource Photo
4 Quanta450 FEG SEM/EBL (Quanta450) HR-SEM/EBL The FEI Quanta450 FEG environmental Scanning Electron Microscope (ESEM) characterizes both conductive and non-conductive samples with SE and BSE high-resolution imaging. The combined Nabity NPGS E-Be... Resource Photo
5 Cryo-Ultramicrotome Leica UC7/FC7 Can be used to prepare specimens for TEM/SEM.... Resource Photo
6 Baltec BAF060 freeze etching system (Freeze fracture) BAF060 Can be used to make replicas of a fractured frozen sample surface. ... Resource Photo
7 Leica EM PACT 2 high pressure freezer (HPF) EM Pact 2 To vitrify aqueous materials... Resource Photo
8 Zeta potential and particle size analyzer (ZetaPLUS) ZetaPLUS ZetaPLUS can measure both particle size (2 − 3,000 nm)and zeta-potential (-220 to 220 mV) of nano- and micro- particles as well as polymers and proteins, based on the dynamic light scattering. Wave ... Resource Photo
9 Transmission Digital Holography Microscope (DHM-T) DHM T-1000 DHM (Digital Holography Microscope) systems are based on a very robust new technology allowing high frequency measurements at interferometric resolution. They are the first instruments to give simul... Resource Photo
10 Bruker FTIR (FTIR ) BrukerFTIR FTIR, MidIR, NearIR, Transmission, Reflection, Microscope, Bench, Grazing Angle, ATR... Resource Photo
11 ThermoFisher Scientific Rheometer HAAKE MARS II (Rheometer) HAAKE MARS II This highly flexible Modular Advanced Rheometer System (MARS) provides accuracy, easy handling, and many application-oriented solutions for comprehensive material characterization. New Connect Assist ... Resource Photo
12 Confocal Laser Scanning Microscope (Confocal) OLS 3100 Olympus LEXT OLS 3100 Light Source: 408nm LD Lateral Resolution: 200nm Vertical Resolution: 10nm 3D Profile Reconstruction... Resource Photo
13 Rame-Hart Goniometer (Goniometer) Rame-Hart 250 The Rame-Hart Goniometer (Model 250) is a powerful tool for measuring the contact angle, surface energy, surface tension, interfacial tension, etc. It works with pendant, inverted pendant, sessile, an... Resource Photo
14 Differential Scanning Calorimeter (DSC) Perkin Elmer/DSC7 The Perkin Elmer DSC7 measures thermal properties of liquids and solids such as the melting temperature and the accompanying latent heat. The operating range is between -10˚ C and 600˚ C.... Resource Photo
15 Tencor Profilometer (Tencor) TENCOR PROF Tencor stylus profilometer, located in AFM Lab (Rm 109 LCM)... Resource Photo
16 High Speed Camera (HS-camera) Phantom v211 A high-speed camera is a central instrumet for softmater recearch such as microfluidics, in which tiny microdrops and bubbles are formed so fast that most of cameras cannot properly caputre their moti... Resource Photo
17 Spectrofluorometer (Fluorolog-3) Fluorolog-3 The Fluorolog®-3 is a unique, modular system which allows the researcher to interchange a versatile range of accessories to correspond perfectly with the characteristics of a given sample. From analy... Resource Photo
18 Chroma Meter (CR-241) Minolta CR-241 Determines the color coordinates of reflective samples in the CIE Standard Observer format. ... Resource Photo